Memory Leak Testing

During the development iterations, a subset of stress-related and memory leak defects were removed before the formal system test entry time due to the early testing by the system test core team.

在开发迭代中，由于系统测试核心团队早期的测试，与压力相关的及内存泄漏缺陷的子集在正式的系统测试开始之前就被除掉了。

Prior to each test, the system testers configured several product parameters to allow the memory leak analysis information to be collected during testing.

在每个测试之前，系统测试人员配置许多产品参数来允许在测试过程中收集内存泄漏分析信息。

Various automation techniques were employed to enable stress/load testing, memory leak analysis, data integrity testing, and regression testing throughout the test effort.

在测试过程中，使用各种自动化的技术来启用压力/负载测试、内存泄漏分析、数据完整性测试，和回归测试。